Scanning Electron Microscopy: Basic Function

video-placeholder
Loading...
查看授课大纲

审阅

4.8(2,655 个评分)

  • 5 stars
    83.38%
  • 4 stars
    14.91%
  • 3 stars
    1.39%
  • 2 stars
    0.18%
  • 1 star
    0.11%

HC

Apr 4, 2021

It's a wonderful course for anybody looking to gain some good insights on Nanotechnology along with practical exposure. Nan Jokerst, you are an amazing teacher.

Would highly recommend this course!

M

May 27, 2020

In my undergrad I have learned about fabrication in the VLSI course, now I have got the gest of cooking. thank you for such a course, hope I will get some further help from rtnn.org & RTNN team.

从本节课中

Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

教学方

  • Placeholder

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering

  • Placeholder

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)

  • Placeholder

    James Cahoon

    Assistant Professor

  • Placeholder

    Jacob Jones

    Professor

探索我们的目录

免费加入并获得个性化推荐、更新和优惠。